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Journal description
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Details for article 2 of 18 found articles
| Title: |
Assessment of interfacial layer thickness of pulsed laser deposited plasmonic copper thin films via spectroscopic ellipsometer |
| Author: |
Kesarwani, Rahul Khare, Alika |
| Appeared in: |
Optical materials |
| Paging: | Volume 93 (2019) nr. C pages 98-102 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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