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                                       Details for article 38 of 86 found articles
 
 
  Local inspection of refractive index and thickness of thick transparent layers using spectral reflectance measurements in low coherence scanning interferometry
 
 
Title: Local inspection of refractive index and thickness of thick transparent layers using spectral reflectance measurements in low coherence scanning interferometry
Author: Claveau, Rémy
Montgomery, Paul
Flury, Manuel
Ferblantier, Gérald
Appeared in: Optical materials
Paging: Volume 86 (2018) nr. C pages 100-105
Year: 2018
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 38 of 86 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands