Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 25 of 129 found articles
 
 
  Efficacy of Raman mapping over ellipsometric spectroscopy and XRD for characterization of structurally heterogeneous PLD nc-Si thin films
 
 
Title: Efficacy of Raman mapping over ellipsometric spectroscopy and XRD for characterization of structurally heterogeneous PLD nc-Si thin films
Author: Dey, Partha P.
Kesarwani, Rahul
Khare, Alika
Appeared in: Optical materials
Paging: Volume 84 (2018) nr. C pages 221-226
Year: 2018
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 129 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands