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Journal description
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Details for article 43 of 61 found articles
| Title: |
Spectroscopic ellipsometry analyses of thin films in different environments: An innovative “reverse side” approach allowing multi angle measurements |
| Author: |
Della Gaspera, Enrico Schutzmann, Stefano Guglielmi, Massimo Martucci, Alessandro |
| Appeared in: |
Optical materials |
| Paging: | Volume 34 (2011) nr. 1 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 43 of 61 found articles
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