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                                       Details for article 5 of 31 found articles
 
 
  Comparison of silicon nanocrystals size determination by Raman scattering and transmission electron microscopy measurements
 
 
Title: Comparison of silicon nanocrystals size determination by Raman scattering and transmission electron microscopy measurements
Author: Blondeau, Jean Philippe
Andreazza, Caroline
Simon, Patrick
Catan, Francis
Allam, Lévi
Appeared in: Optical materials
Paging: Volume 29 (2006) nr. 2-3 pages 8 p.
Year: 2006
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 31 found articles
 
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