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Corrigendum to “Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL” [Opt. Mater. 156 (2024) 116031] |
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Titel: |
Corrigendum to “Hard X-ray nanoprobe to study the emission properties of Ce-doped YAG wafer by using XEOL and TR-XEOL” [Opt. Mater. 156 (2024) 116031] |
Auteur: |
Li, Yi-Chen Huang, Tzu-Chi Wu, Yu-Hao Wei, Wei-Lon Wu, Tai-Sing Chang, Lo-Yeuh Lee, Chien-Yu Chen, Bo-Yi Yin, Gung-Chian Tang, Mau-Tsu Lin, Bi-Hsuan |
Verschenen in: |
Optical materials |
Paginering: |
Jaargang 157 () nr. P2 pagina's p. |
Jaar: |
2024 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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