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                                       Details for article 90 of 167 found articles
 
 
  Nanoscale Raman mapping of elastic stresses in multilayer heterostructure based on multi-period GaN/AlN superlattices grown using HVPE technology on hybrid SiC/Si substrate
 
 
Title: Nanoscale Raman mapping of elastic stresses in multilayer heterostructure based on multi-period GaN/AlN superlattices grown using HVPE technology on hybrid SiC/Si substrate
Author: Seredin, P.V.
Sharofidinov, Sh. Sh.
Goloshchapov, D.L.
Peshkov, Y.A.
Ivkov, S.A.
Buylov, N.S.
Eremeev, K.A.
Kukushkin, S.A.
Appeared in: Optical materials
Paging: Volume 150 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 90 of 167 found articles
 
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