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                                       Details for article 29 of 196 found articles
 
 
  Current-induced degradation process in (In)AlGaN-based deep-UV light-emitting diode fabricated on AlN/sapphire template
 
 
Title: Current-induced degradation process in (In)AlGaN-based deep-UV light-emitting diode fabricated on AlN/sapphire template
Author: Dalapati, Pradip
Yamamoto, Kosuke
Egawa, Takashi
Miyoshi, Makoto
Appeared in: Optical materials
Paging: Volume 109 () nr. C pages p.
Year: 2020
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 29 of 196 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands