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Journal description
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Details for article 140 of 196 found articles
| Title: |
Probing the optimal refractive index profile of disordered silicon nanowires for photon management applications |
| Author: |
Saini, Sudhir Kumar Nair, Rajesh V. |
| Appeared in: |
Optical materials |
| Paging: | Volume 109 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 140 of 196 found articles
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