|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 14 of 69 found articles
| Title: |
Extended X-ray absorption fine structure studies of GaN epilayers doped with Er |
| Author: |
Katchkanov, V. Mosselmans, J.F.W. O’Donnell, K.P. Nogales, E. Hernandez, S. Martin, R.W. Steckl, A. Lee, D.S. |
| Appeared in: |
Optical materials |
| Paging: | Volume 28 (2006) nr. 6-7 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 69 found articles
| << previous | next >> |