Radiation damage effects on the silicon microstrip detector in E789 - A fixed target experiment at fermilab
Titel:
Radiation damage effects on the silicon microstrip detector in E789 - A fixed target experiment at fermilab
Auteur:
Kapustinsky, J.S. Apolinski, M. Boissevain, J. Brown, C.N. Brown, G. Carey, T.A. Chen, Y.C. Childers, R. Cooper, W.E. Darden, C.W. Gidal, G. Glass, H.D. Gounder, K.N. Ho, P.M. Isenhower, D. Jansen, D.M. Jeppesen, R. Kaplan, D.M. Kiang, G.C. Kowitt, M.S. Lane, D.W. Lederman, L. Leitch, M.J. Lillberg, J.W. Luebke, W. Luk, K.B. Martin, V.M. McGaughey, P.L. Mishra, C.S. Moss, J.M. Peng, J.C. Preston, R.S. Pripstein, D. Sa, J. Sadler, M. Schnathorst, R. Schub, M.H. Schwint, R. Snodgrass, D. Tanikella, V.N. Teng, P.K. Wilson, J.W.