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Detection of interfacial strain and phase separation in MBa2Cu3O7−x thin films using Raman spectroscopy and X-ray diffraction space mapping |
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Titel: |
Detection of interfacial strain and phase separation in MBa2Cu3O7−x thin films using Raman spectroscopy and X-ray diffraction space mapping |
Auteur: |
Venkataraman, K. Kropf, A.J. Segre, C.U. Jia, Q.X. Goyal, A. Kang, B.W. Chattopadhyay, S. You, H. Maroni, V.A. |
Verschenen in: |
Physica. C, Superconductivity and its applications |
Paginering: |
Jaargang 402 (2004) nr. 1-2 pagina's 16 p. |
Jaar: |
2004 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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