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                                       Details for article 83 of 108 found articles
 
 
  Relatively thick (few micrometers) film structure estimated by back-incidence neutron reflectometry
 
 
Title: Relatively thick (few micrometers) film structure estimated by back-incidence neutron reflectometry
Author: Miyata, Noboru
Miyazaki, Tsukasa
Appeared in: Physica. B, Condensed matter
Paging: Volume 551 (2018) nr. C pages 449-451
Year: 2018
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 83 of 108 found articles
 
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