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                                       Details for article 45 of 68 found articles
 
 
  Precipitation in silicon wafers after high temperature preanneal studied by X-ray diffraction methods
 
 
Title: Precipitation in silicon wafers after high temperature preanneal studied by X-ray diffraction methods
Author: Meduňa, M.
Růžička, J.
Caha, O.
Buršík, J.
Svoboda, M.
Appeared in: Physica. B, Condensed matter
Paging: Volume 407 (2012) nr. 15 pages 4 p.
Year: 2012
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 45 of 68 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands