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Journal description
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Details for article 36 of 62 found articles
| Title: |
Quantitative strain characterization of SiGe heterostructures by high-resolution transmission electron microscopy |
| Author: |
Zhao, C.W. Xing, Y.M. Yu, J.Z. Han, G.Q. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 405 (2010) nr. 16 pages 3 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 62 found articles
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