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Details for article 4766 of 6539 found articles
| Title: |
Rapid thermal annealing influences on microstructure and electrical properties of Mo/ZrO2/n-Si/Al MISM junction with a high-k ZrO2 insulating layer |
| Author: |
Manjunath, V. Uppala, Chalapathi Bommireddy, Purusottam Reddy Son, Boseong Kim, Huijin Ahn, Chang-Hoi Park, Si-Hyun |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 648 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4766 of 6539 found articles
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