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                                       Details for article 4117 of 6539 found articles
 
 
  On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer
 
 
Title: On frequency and voltage dependent physical characteristics and interface states characterization of the metal semiconductor (MS) structures with (Ti:DLC) interlayer
Author: Berkün, Ö.
Ulusoy, M.
Altındal, Ş.
Avar, B.
Appeared in: Physica. B, Condensed matter
Paging: Volume 666 () nr. C pages p.
Year: 2023
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4117 of 6539 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands