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Details for article 1352 of 6539 found articles
| Title: |
Effect of grown-in biaxial strain on deep level defects in Si1−y
C
y
/Si epitaxial heterostructures |
| Author: |
Singh, D.V. Mitchell, T.O. Hoyt, J.L. Gibbons, J.F. Johnson, N.M. Götz, W.K. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 273-274 (1999) nr. C pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1352 of 6539 found articles
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