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Details for article 2382 of 2395 found articles
| Title: |
X-ray diffraction measurement at 0.20
K |
| Author: |
Naher, S. Suzuki, H. Mizuno, M. Xue, Y. Fujishita, H. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 329-333 (2003) nr. P2 pages 2 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2382 of 2395 found articles
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