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Details for article 2642 of 18303 found articles
| Title: |
Defect characterization of MOCVD grown AlN/AlGaN films on sapphire substrates by TEM and TKD |
| Author: |
O’Connell, J.H. Lee, M.E. Westraadt, J. Engelbrecht, J.A.A. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 535 (2018) nr. C pages 293-298 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2642 of 18303 found articles
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