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Details for article 1180 of 18303 found articles
| Title: |
Atomistic structure of stacking faults in a commercial GaAs:Si wafer revealed by cross-sectional scanning tunneling microscopy |
| Author: |
Ohno, Y. Taishi, T. Yonenaga, I. Takeda, S. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 401-402 (2007) nr. C pages 4 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1180 of 18303 found articles
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