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Details for article 1072 of 18303 found articles
| Title: |
Assesment of a model to calculate the refractive index of AlXGa1-XN epilayers using the multi-oscillator model simulation of the infrared reflectance |
| Author: |
Engelbrecht, J.A.A. Minnaar, E.G. van Dyk, E.E. Westraadt, J.E. Sephton, B. Lee, M.E. Henry, A. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 625 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1072 of 18303 found articles
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