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Journal description
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Details for article 21 of 34 found articles
| Title: |
Structural characterization of InGaN thin films and multiple quantum wells: an approach of combining various X-ray scattering methods |
| Author: |
Lee, H.H Jang, H.W Kim, D.H Noh, D.Y Yi, M.S Tang, M Liang, K.S |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 336 (2003) nr. 1-2 pages 9 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 34 found articles
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