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                                       Details for article 2886 of 6539 found articles
 
 
  Large-scale electronic-structure theory and nanoscale defects formed in cleavage process of silicon
 
 
Title: Large-scale electronic-structure theory and nanoscale defects formed in cleavage process of silicon
Author: Hoshi, T.
Takayama, R.
Iguchi, Y.
Fujiwara, T.
Appeared in: Physica. B, Condensed matter
Paging: Volume 376-377 (2006) nr. C pages 4 p.
Year: 2006
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2886 of 6539 found articles
 
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