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Journal description
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Details for article 602 of 6662 found articles
| Title: |
Characterization of buried SiN
x
films with EXAFS and NEXAFS |
| Author: |
Paloura, E.C. Mertens, A. Frentrup, W. Döbler, U. Knop, A. Braun, W. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 208-209 (1995) nr. C pages 2 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 602 of 6662 found articles
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