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Details for article 1025 of 6662 found articles
| Title: |
Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry |
| Author: |
Yakshin, A.E Louis, E Görts, P.C Maas, E.L.G Bijkerk, F |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 283 (2000) nr. 1-3 pages 6 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1025 of 6662 found articles
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