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Journal description
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Details for article 4730 of 6539 found articles
| Title: |
Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation |
| Author: |
Ohyama, H. Takakura, K. Uemura, K. Shigaki, K. Kudou, T. Arai, M. Kuboyama, S. Matsuda, S. Kamezawa, C. Simoen, E. Claeys, C. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 376-377 (2006) nr. C pages 3 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4730 of 6539 found articles
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