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Journal description
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Details for article 2750 of 6539 found articles
| Title: |
Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD |
| Author: |
Stöger, M Breymesser, A Schlosser, V Ramadori, M Plunger, V Peiró, D Voz, C Bertomeu, J Nelhiebel, M Schattschneider, P Andreu, J |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 273-274 (1999) nr. C pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2750 of 6539 found articles
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