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Details for article 163 of 6539 found articles
| Title: |
Analysis of photoluminescence spectra for detection of stress-induced defects in silicon substrates after the polycrystalline diamond film deposition |
| Author: |
Bagaev, Victor S. Aminev, Denis F. Galkina, Tatiana I. Klokov, Andrey Yu. Krivobok, Vladimir S. Ralchenko, Victor G. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 404 (2009) nr. 23-24 pages 3 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 163 of 6539 found articles
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