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Details for article 162 of 299 found articles
| Title: |
In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films |
| Author: |
Wang, H. Sun, G.A. Chen, B. Fu, Y.Q. Wang, X.L. Zu, X.T. Shen, H.H. Liu, Y.P. Li, L.B. Pan, G.Q. Sheng, L.S. Tian, Q. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 407 (2012) nr. 17 pages 4 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 162 of 299 found articles
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