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                                       Details for article 271 of 279 found articles
 
 
  The use of neutron diffraction in the quantitative characterization of dopant-dependent dynamical properties of semiconductors
 
 
Title: The use of neutron diffraction in the quantitative characterization of dopant-dependent dynamical properties of semiconductors
Author: Martı́n y Marero, D
Corregidor, V
Fiederle, M
Diéguez, E
Appeared in: Physica. B, Condensed matter
Paging: Volume 350 (2004) nr. 1-3S pages nvt p.
Year: 2004
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 271 of 279 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands