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Details for article 7007 of 18303 found articles
| Title: |
High temperature annealings of Sb and Sb/B heavily implanted silicon wafers studied by near grazing incidence fluorescence EXAFS |
| Author: |
Brizard, C. Regnard, J.R. Demourgues, A. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 208-209 (1995) nr. C pages 3 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7007 of 18303 found articles
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