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                                       Details for article 18075 of 18303 found articles
 
 
  Voltage and frequency reliant interface traps and their lifetimes of the MPS structures interlayered with CdTe:PVA via the admittance method
 
 
Title: Voltage and frequency reliant interface traps and their lifetimes of the MPS structures interlayered with CdTe:PVA via the admittance method
Author: Guclu, Cigdem Sukriye
Altındal, Şemsettin
Erbilen Tanrikulu, Esra
Appeared in: Physica. B, Condensed matter
Paging: Volume 677 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18075 of 18303 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands