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Details for article 12873 of 18303 found articles
| Title: |
Probing defects at interfaces and interlayers of low-dimensional Si/insulator (HfO2; LaAlO3) structures by electron spin resonance |
| Author: |
Stesmans, A. Afanas’ev, V.V. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 401-402 (2007) nr. C pages 6 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12873 of 18303 found articles
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