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Details for article 671 of 675 found articles
| Title: |
X-ray diffraction stress analysis of ferroelectric thin films with ideal (h
k
l) textures considering the piezoelectric coupling effect |
| Author: |
Wu, Huaping Wu, Linzhi Li, Jiquan Chai, Guozhong Du, Shanyi |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 405 (2010) nr. 4 pages 6 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 671 of 675 found articles
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