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Details for article 1838 of 1846 found articles
| Title: |
X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics |
| Author: |
Jergel, M. Holý, V. Majková, E. Luby, Š. Senderák, R. Stock, H.J. Menke, D. Kleineberg, U. Heinzmann, U. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 253 (1998) nr. 1-2 pages 12 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1838 of 1846 found articles
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