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  Application of a stacked elastically bent perfect Si monochromator with identical and different crystallographic planes for single crystal and powder neutron diffractometry
 
 
Title: Application of a stacked elastically bent perfect Si monochromator with identical and different crystallographic planes for single crystal and powder neutron diffractometry
Author: Tanaka, I
Ahmed, F.U
Niimura, N
Appeared in: Physica. B, Condensed matter
Paging: Volume 283 (2000) nr. 4 pages 4 p.
Year: 2000
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 50 of 675 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands