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Journal description
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Details for article 4160 of 4181 found articles
| Title: |
X-ray interface characterization of Ge δ layers on Si (001) |
| Author: |
Bahr, D. Falta, J. Materlik, G. Müller, B.H. Horn-von Hoegen, M. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 221 (1996) nr. 1-4 pages 5 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. All rights reserved |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4160 of 4181 found articles
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