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Details for article 1698 of 18303 found articles
| Title: |
Charge trap analysis of nanolayer Si3N4 and SiO2 by electron irradiation assisted photoelectron emission |
| Author: |
Dekhtyar, Yuri Enichek, Gennady Romanova, Marina Schmidt, Ben Vilken, Aleksandr Yager, Tom Zaslavski, Aleksandr |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 586 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1698 of 18303 found articles
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