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Details for article 8093 of 18303 found articles
| Title: |
Investigation of structural defects of thick GaN grown by flow-modulated hydride vapor-phase epitaxy |
| Author: |
Zhang, Wei Alves, Helder R. Riemann, Till Heuken, M. Veit, Peter Meister, Dirk Kriegseis, Wilhelm Hofmann, Detlev M. Christen, Juergen Meyer, Bruno K. |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 308-310 (2001) nr. C pages 4 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8093 of 18303 found articles
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