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Details for article 1505 of 18303 found articles
| Title: |
Capacitance X-ray absorption fine structure measurement using scanning probe A new method for local structure analysis of surface defects |
| Author: |
Ishii, Masashi |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 308-310 (2001) nr. C pages 4 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1505 of 18303 found articles
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