A method to relate the presence of structural defects and impurities and their impact on the electrical activity in silicon for photovoltaic applications
Titel:
A method to relate the presence of structural defects and impurities and their impact on the electrical activity in silicon for photovoltaic applications
Auteur:
Houam, Sirine Ouaddah, Hadjer Regula, Gabrielle Périchaud, Isabelle Reinhart, Guillaume Di Sabatino Lundberg, Marisa Vines, Lasse Silly, Mathieu G. Guittonneau, Fabrice Barrallier, Laurent Pihan, Etienne Mangelinck-Noël, Nathalie