Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part II: Accelerated tests
Titel:
Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part II: Accelerated tests
Auteur:
Julien, Scott E. Kempe, Michael D. Eafanti, Joshua J. Morse, Joshua Wang, Yu Fairbrother, Andrew W. Napoli, Sophie Hauser, Adam W. Ji, Liang O’Brien, Gregory S. Gu, Xiaohong French, Roger H. Bruckman, Laura S. Wan, Kai-tak Boyce, Kenneth P.