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Theoretical analysis of effects of deep level, back contact, and absorber thickness on capacitance–voltage profiling of CdTe thin-film solar cells |
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Titel: |
Theoretical analysis of effects of deep level, back contact, and absorber thickness on capacitance–voltage profiling of CdTe thin-film solar cells |
Auteur: |
Li, Jian V. Halverson, Adam F. Sulima, Oleg V. Bansal, Shubhra Burst, James M. Barnes, Teresa M. Gessert, Timothy A. Levi, Dean H. |
Verschenen in: |
Solar energy materials and solar cells |
Paginering: |
Jaargang 100 (2012) nr. C pagina's 6 p. |
Jaar: |
2012 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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