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  A break-even analysis of RFID technology for inventory sensitive to shrinkage
 
 
Title: A break-even analysis of RFID technology for inventory sensitive to shrinkage
Author: de Kok, A.G.
van Donselaar, K.H.
van Woensel, T.
Appeared in: International journal of production economics
Paging: Volume 112 (2008) nr. 2 pages 11 p.
Year: 2008
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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