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                                       Details for article 12 of 22 found articles
 
 
  Etch rates of (100), (111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry
 
 
Title: Etch rates of (100), (111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry
Author: Steinsland, Elin
Finstad, Terje
Hanneborg, Anders
Appeared in: Sensors and Actuators. A, Physical
Paging: Volume 86 (2000) nr. 1-2 pages 8 p.
Year: 2000
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 22 found articles
 
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