|
Raman scattering, photoluminescence, and X-ray diffraction studies of GaN layers grown on misoriented sapphire substrates |
|
|
|
Titel: |
Raman scattering, photoluminescence, and X-ray diffraction studies of GaN layers grown on misoriented sapphire substrates |
Auteur: |
Benyoucef, M Kuball, M Koleske, D.D Wickenden, A.E Henry, R.L Fatemi, M Twigg, M.E |
Verschenen in: |
Materials science and engineering. B, Solid-state materials for advanced technology |
Paginering: |
Jaargang 93 (2002) nr. 1-3 pagina's 4 p. |
Jaar: |
2002 |
Inhoud: |
|
Uitgever: |
Elsevier Science B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|