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Journal description
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Details for article 1 of 46 found articles
| Title: |
Analysis of the device characteristics of AlGaN/GaN HEMTs over a wide temperature range |
| Author: |
Zhao, M. Liu, X.Y. Zheng, Y.K. Li, Yankui Ouyang, Sihua |
| Appeared in: |
Materials science and engineering. B, Solid-state materials for advanced technology |
| Paging: | Volume 178 (2013) nr. 7 pages 6 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 46 found articles
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