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Details for article 45 of 52 found articles
| Title: |
Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53Al x Ga0.47−xAs layers on InP in the wavelength range 280–1900 nm |
| Author: |
Dinges, H.W. Burkhard, H. Lösch, R. Nickel, H. Schlapp, W. |
| Appeared in: |
Materials science and engineering. B, Solid-state materials for advanced technology |
| Paging: | Volume 21 (1993) nr. 2-3 pages 3 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 45 of 52 found articles
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