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                                       Details for article 24 of 52 found articles
 
 
  Investigation of MOVPE-grown In0.53Ga0.47 As/InP multi-quantum wells by Raman spectroscopy and X-ray diffractometry
 
 
Title: Investigation of MOVPE-grown In0.53Ga0.47 As/InP multi-quantum wells by Raman spectroscopy and X-ray diffractometry
Author: Finders, J.
Keuter, M.
Gnoth, D.
Geurts, J.
Woitok, J.
Kohl, A.
Müller, R.
Heime, K.
Appeared in: Materials science and engineering. B, Solid-state materials for advanced technology
Paging: Volume 21 (1993) nr. 2-3 pages 4 p.
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 52 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands